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CLC number: TQ172

On-line Access: 2013-11-04

Received: 2013-06-21

Revision Accepted: 2013-09-26

Crosschecked: 2013-10-12

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Journal of Zhejiang University SCIENCE A 2013 Vol.14 No.11 P.815-821

http://doi.org/10.1631/jzus.A1300215


Rietveld quantification of γ-C2S conversion rate supported by synchrotron X-ray diffraction images*


Author(s):  Pi-qi Zhao1,2, Xian-ping Liu1,2, Jian-guo Wu1,2, Pei-ming Wang1,2

Affiliation(s):  1. School of Materials Science and Engineering, Tongji University, Shanghai 201804, China; more

Corresponding email(s):   1987zhaopq@tongji.edu.cn

Key Words:  &gamma, -C2S, &beta, -C2S, Rietveld quantification, Synchrotron X-ray diffraction image


Pi-qi Zhao, Xian-ping Liu, Jian-guo Wu, Pei-ming Wang. Rietveld quantification of γ-C2S conversion rate supported by synchrotron X-ray diffraction images[J]. Journal of Zhejiang University Science A, 2013, 14(11): 815-821.

@article{title="Rietveld quantification of γ-C2S conversion rate supported by synchrotron X-ray diffraction images",
author="Pi-qi Zhao, Xian-ping Liu, Jian-guo Wu, Pei-ming Wang",
journal="Journal of Zhejiang University Science A",
volume="14",
number="11",
pages="815-821",
year="2013",
publisher="Zhejiang University Press & Springer",
doi="10.1631/jzus.A1300215"
}

%0 Journal Article
%T Rietveld quantification of γ-C2S conversion rate supported by synchrotron X-ray diffraction images
%A Pi-qi Zhao
%A Xian-ping Liu
%A Jian-guo Wu
%A Pei-ming Wang
%J Journal of Zhejiang University SCIENCE A
%V 14
%N 11
%P 815-821
%@ 1673-565X
%D 2013
%I Zhejiang University Press & Springer
%DOI 10.1631/jzus.A1300215

TY - JOUR
T1 - Rietveld quantification of γ-C2S conversion rate supported by synchrotron X-ray diffraction images
A1 - Pi-qi Zhao
A1 - Xian-ping Liu
A1 - Jian-guo Wu
A1 - Pei-ming Wang
J0 - Journal of Zhejiang University Science A
VL - 14
IS - 11
SP - 815
EP - 821
%@ 1673-565X
Y1 - 2013
PB - Zhejiang University Press & Springer
ER -
DOI - 10.1631/jzus.A1300215


Abstract: 
The pure &gamma;-Ca2SiO4 (&gamma;2S%29&ck%5B%5D=abstract&ck%5B%5D=keyword'>-C2S%29&ck%5B%5D=abstract&ck%5B%5D=keyword'>-C2S) phase was prepared at 1623 K of calcining temperature, 10 h of holding time and furnace cooling. The &beta;2S%29&ck%5B%5D=abstract&ck%5B%5D=keyword'>-C2S%29&ck%5B%5D=abstract&ck%5B%5D=keyword'>-C2S phase was obtained through &gamma;2S%29&ck%5B%5D=abstract&ck%5B%5D=keyword'>-C2S%29&ck%5B%5D=abstract&ck%5B%5D=keyword'>-C2S conversion with the following calcination system which was adopted at 1473 K of calcining temperature, 1 h of holding time and then water-cooling. The conversion rate of &gamma;2S%29&ck%5B%5D=abstract&ck%5B%5D=keyword'>-C2S%29&ck%5B%5D=abstract&ck%5B%5D=keyword'>-C2S was studied by the Rietveld quantitative laboratory X-ray powder diffraction supported by synchrotron X-ray diffraction images. The refinement results show that the final conversion rate of &gamma;2S%29&ck%5B%5D=abstract&ck%5B%5D=keyword'>-C2S%29&ck%5B%5D=abstract&ck%5B%5D=keyword'>-C2S is higher than 92%. The absolute error of the &gamma;2S%29&ck%5B%5D=abstract&ck%5B%5D=keyword'>-C2S%29&ck%5B%5D=abstract&ck%5B%5D=keyword'>-C2S conversion rate between two Rietveld refinements (sample with or without α-Al2O3) is 3.6%, which shows that the Rietveld quantitative X-ray diffraction analysis is an appropriate and accurate method to quantify the &gamma;2S%29&ck%5B%5D=abstract&ck%5B%5D=keyword'>-C2S%29&ck%5B%5D=abstract&ck%5B%5D=keyword'>-C2S conversion rate.

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