Publishing Service

Polishing & Checking

Frontiers of Information Technology & Electronic Engineering

ISSN 2095-9184 (print), ISSN 2095-9230 (online)

2017 Vol.18 No.10 P.1678-1678

Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps

Jian Hao, Lei Jing, Hong-liang Ke, Yao Wang, Qun Gao, Xiao-xun Wang, Qiang Sun, Zhi-jun Xu

University of Chinese Academy of Sciences, Beijing 100049, China; Opto-Electronics Technology Center, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China

sunq@ciomp.ac.cn

Abstract:

Erratum to: Front. Inform. Technol. Electron. Eng., 2017 18(8):1197-1204. doi:10.1631/FITEE.1500483

Key words: LED lamp; Accelerated aging test; Medium lifetime; Moving average error


Share this article to： More

Go to Contents

References:

<Show All>

Open peer comments: Debate/Discuss/Question/Opinion

<1>

Please provide your name, email address and a comment





DOI:

10.1631/FITEE.15e0483

CLC number:

Download Full Text:

Click Here

Downloaded:

5395

Clicked:

4572

Cited:

0

On-line Access:

2017-12-04

Received:

2022-04-22

Revision Accepted:

2022-04-22

Crosschecked:

2022-04-22

Journal of Zhejiang University-SCIENCE, 38 Zheda Road, Hangzhou 310027, China
Tel: +86-571-87952276; Fax: +86-571-87952331; E-mail: jzus@zju.edu.cn
Copyright © 2000~ Journal of Zhejiang University-SCIENCE