|
Journal of Zhejiang University SCIENCE A
ISSN 1673-565X(Print), 1862-1775(Online), Monthly
2013 Vol.14 No.11 P.815-821
Rietveld quantification of γ-C2S conversion rate supported by synchrotron X-ray diffraction images
Abstract: The pure γ-Ca2SiO4 (γ-C2S) phase was prepared at 1623 K of calcining temperature, 10 h of holding time and furnace cooling. The β-C2S phase was obtained through γ-C2S conversion with the following calcination system which was adopted at 1473 K of calcining temperature, 1 h of holding time and then water-cooling. The conversion rate of γ-C2S was studied by the Rietveld quantitative laboratory X-ray powder diffraction supported by synchrotron X-ray diffraction images. The refinement results show that the final conversion rate of γ-C2S is higher than 92%. The absolute error of the γ-C2S conversion rate between two Rietveld refinements (sample with or without α-Al2O3) is 3.6%, which shows that the Rietveld quantitative X-ray diffraction analysis is an appropriate and accurate method to quantify the γ-C2S conversion rate.
Key words: γ-C2S, β-C2S, Rietveld quantification, Synchrotron X-ray diffraction image
References:
Open peer comments: Debate/Discuss/Question/Opinion
<1>
DOI:
10.1631/jzus.A1300215
CLC number:
TQ172
Download Full Text:
Downloaded:
2667
Download summary:
<Click Here>Downloaded:
2260Clicked:
4577
Cited:
0
On-line Access:
2013-11-04
Received:
2013-06-21
Revision Accepted:
2013-09-26
Crosschecked:
2013-10-12