Publishing Service

Polishing & Checking

Journal of Zhejiang University SCIENCE A

ISSN 1673-565X(Print), 1862-1775(Online), Monthly

Rietveld quantification of γ-C2S conversion rate supported by synchrotron X-ray diffraction images

Abstract: The pure γ-Ca2SiO4 (γ-C2S) phase was prepared at 1623 K of calcining temperature, 10 h of holding time and furnace cooling. The β-C2S phase was obtained through γ-C2S conversion with the following calcination system which was adopted at 1473 K of calcining temperature, 1 h of holding time and then water-cooling. The conversion rate of γ-C2S was studied by the Rietveld quantitative laboratory X-ray powder diffraction supported by synchrotron X-ray diffraction images. The refinement results show that the final conversion rate of γ-C2S is higher than 92%. The absolute error of the γ-C2S conversion rate between two Rietveld refinements (sample with or without α-Al2O3) is 3.6%, which shows that the Rietveld quantitative X-ray diffraction analysis is an appropriate and accurate method to quantify the γ-C2S conversion rate.

Key words: γ-C2S, β-C2S, Rietveld quantification, Synchrotron X-ray diffraction image


Share this article to: More

Go to Contents

References:

<Show All>

Open peer comments: Debate/Discuss/Question/Opinion

<1>

Please provide your name, email address and a comment





DOI:

10.1631/jzus.A1300215

CLC number:

TQ172

Download Full Text:

Click Here

Downloaded:

2667

Download summary:

<Click Here> 

Downloaded:

2260

Clicked:

4577

Cited:

0

On-line Access:

2013-11-04

Received:

2013-06-21

Revision Accepted:

2013-09-26

Crosschecked:

2013-10-12

Journal of Zhejiang University-SCIENCE, 38 Zheda Road, Hangzhou 310027, China
Tel: +86-571-87952276; Fax: +86-571-87952331; E-mail: jzus@zju.edu.cn
Copyright © 2000~ Journal of Zhejiang University-SCIENCE