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Frontiers of Information Technology & Electronic Engineering

ISSN 2095-9184 (print), ISSN 2095-9230 (online)

2017 Vol.18 No.10 P.1678-1678

Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps

Jian Hao, Lei Jing, Hong-liang Ke, Yao Wang, Qun Gao, Xiao-xun Wang, Qiang Sun, Zhi-jun Xu

University of Chinese Academy of Sciences, Beijing 100049, China; Opto-Electronics Technology Center, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China

sunq@ciomp.ac.cn

Abstract:

Erratum to: Front. Inform. Technol. Electron. Eng., 2017 18(8):1197-1204. doi:10.1631/FITEE.1500483

Key words: LED lamp; Accelerated aging test; Medium lifetime; Moving average error


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DOI:

10.1631/FITEE.15e0483

CLC number:

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On-line Access:

2024-08-27

Received:

2023-10-17

Revision Accepted:

2024-05-08

Crosschecked:

2022-04-22

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