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Frontiers of Information Technology & Electronic Engineering

ISSN 2095-9184 (print), ISSN 2095-9230 (online)

Versionized process based on non-volatile random-access memory for fine-grained fault tolerance

Abstract: Non-volatile random-access memory (NVRAM) technology is maturing rapidly and its byte-persistence feature allows the design of new and efficient fault tolerance mechanisms. In this paper we propose the versionized process (VerP), a new process model based on NVRAM that is natively non-volatile and fault tolerant. We introduce an intermediate software layer that allows us to run a process directly on NVRAM and to put all the process states into NVRAM, and then propose a mechanism to versionize all the process data. Each piece of the process data is given a special version number, which increases with the modification of that piece of data. The version number can effectively help us trace the modification of any data and recover it to a consistent state after a system crash. Compared with traditional checkpoint methods, our work can achieve fine-grained fault tolerance at very little cost.

Key words: Non-volatile memory, Byte-persistence, Versionized process, Version number

Chinese Summary  <26> 基于非易失存储器的版本化进程细粒度容错

概要:新型非易失存储器(NVRAM)提供的字节粒度持久且非易失新特性,将有力支持新型容错技术的设计。提出一个基于NVRAM的新型容错进程模型--版本化进程(versionized process,VerP)。该进程模型通过在传统软硬件之间引入一个软件中间层,将软硬件解耦合,在NVRAM上重新组织进程所有数据,从而支持进程在NVRAM的天然容错。进一步,赋予进程中每个数据一个版本号,通过更新版本号实现进程非易失数据的一致性更新。与传统检查点机制相比,VerP可高效支持细粒度容错。

关键词组:非易失存储器;字节粒度持久;版本化进程;版本号


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DOI:

10.1631/FITEE.1601477

CLC number:

TP316

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On-line Access:

2018-04-09

Received:

2016-08-16

Revision Accepted:

2016-11-07

Crosschecked:

2018-02-15

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