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Frontiers of Information Technology & Electronic Engineering
ISSN 2095-9184 (print), ISSN 2095-9230 (online)
2019 Vol.20 No.9 P.1175-1184
Wheat ear growth modeling based on a polygon
Abstract: Visual inspection of wheat growth has been a useful tool for understanding and implementing agricultural techniques and a way to accurately predict the growth status of wheat yields for economists and policy decision makers. In this paper, we present a polygonal approach for modeling the growth process of wheat ears. The grain, lemma, and palea of wheat ears are represented as editable polygonal models, which can be re-polygonized to detect collision during the growth process. We then rotate and move the colliding grain to resolve the collision problem. A linear interpolation and a spherical interpolation are developed to simulate the growth of wheat grain, performed in the process of heading and growth of wheat grain. Experimental results show that the method has a good modeling effect and can realize the modeling of wheat ears at different growth stages.
Key words: Visual inspection, Virtual crop, Three-dimensional modeling
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DOI:
10.1631/FITEE.1800702
CLC number:
TP391.9
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On-line Access:
2024-08-27
Received:
2023-10-17
Revision Accepted:
2024-05-08
Crosschecked:
2019-09-04