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Journal of Zhejiang University SCIENCE B
ISSN 1673-1581(Print), 1862-1783(Online), Monthly
2005 Vol.6 No.11 P.1135-1140
Influence of polarized bias and porous silicon morphology on the electrical behavior of Au-porous silicon contacts
Abstract: This paper reports the surface morphology and I-V curves of porous silicon (PS) samples and related devices. The observed fabrics on the PS surface were found to affect the electrical property of PS devices. When the devices were operated under different external bias (10 V or 3 V) for 10 min, their observed obvious differences in electrical properties may be due to the different control mechanisms in the Al/PS interface and PS matrix morphology.
Key words: Porous silicon, Morphology, Electrical properties
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DOI:
10.1631/jzus.2005.B1135
CLC number:
TN2
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2024-08-27
Received:
2023-10-17
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2024-05-08
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