Journal of Zhejiang University

Deep search:Searching for "Yunhe PAN" in 'AUTHOR' Got 7 items.

index	Title
1	Unsupervised object detection with scene-adaptive concept learning Author(s):Shiliang Pu, Wei Zhao, Weijie Chen... Clicked:5818 Download:4485 Cited:0 <Full Text> <PPT> 1489 Frontiers of Information Technology & Electronic Engineering 2021 Vol.22 No.5 P.638-651 DOI:10.1631/FITEE.2000567
2	Multiple knowledge representation for big data artificial intelligence: framework, applications, and case s... Author(s):Yi Yang, Yueting Zhuang, Yunhe Pan Clicked:4607 Download:5216 Cited:0 <Full Text> <PPT> 865 Frontiers of Information Technology & Electronic Engineering 2021 Vol.22 No.12 P.1551-1558 DOI:10.1631/FITEE.2100463
3	On visual understanding Author(s):Yunhe PAN Clicked:1670 Download:3354 Cited:0 <Full Text> Frontiers of Information Technology & Electronic Engineering 2022 Vol.23 No.9 P.1287-1289 DOI:10.1631/FITEE.2130000
4	Visual recognition of cardiac pathology based on 3D parametric model reconstruction Author(s):Jinxiao XIAO, Yansong LI, Yun TIAN... Clicked:1835 Download:5550 Cited:0 <Full Text> <PPT> 322 Frontiers of Information Technology & Electronic Engineering 2022 Vol.23 No.9 P.1324-1337 DOI:10.1631/FITEE.2200102
5	Visual knowledge guided intelligent generation of Chinese seal carving Author(s):Kejun ZHANG, Rui ZHANG, Yehang YIN... Clicked:5032 Download:9073 Cited:0 <Full Text> <PPT> 318 Frontiers of Information Technology & Electronic Engineering 2022 Vol.23 No.10 P.1479-1493 DOI:10.1631/FITEE.2100094
6	A knowledge-guided and traditional Chinese medicine informed approach for herb recommendation Author(s):Zhe JIN, Yin ZHANG, Jiaxu MIAO, Yi... Clicked:1011 Download:3987 Cited:0 <Full Text> <PPT> 189 Frontiers of Information Technology & Electronic Engineering 2023 Vol.24 No.10 P.1416-1429 DOI:10.1631/FITEE.2200662
7	Visual knowledge in the big model era: Retrospect and prospect Author(s):Wenguan WANG, Yi YANG, Yunhe PAN Clicked:100 Download:79 Cited:0 <Full Text> Frontiers of Information Technology & Electronic Engineering 1998 Vol.-1 No.-1 P. DOI:10.1631/FITEE.2400250