Deep search:Searching for "Yunhe PAN" in 'AUTHORGot 7 items.
index Title
1Unsupervised object detection with scene-adaptive concept learning
Author(s):Shiliang Pu, Wei Zhao, Weijie Chen...  Clicked:5767  Download:4443  Cited:0  <Full Text>  <PPT> 1482
Frontiers of Information Technology & Electronic Engineering  2021 Vol.22 No.5 P.638-651  DOI:10.1631/FITEE.2000567
2Multiple knowledge representation for big data artificial intelligence: framework, applications, and case s...
Author(s):Yi Yang, Yueting Zhuang, Yunhe Pan  Clicked:4580  Download:5109  Cited:0  <Full Text>  <PPT> 855
Frontiers of Information Technology & Electronic Engineering  2021 Vol.22 No.12 P.1551-1558  DOI:10.1631/FITEE.2100463
3On visual understanding
Author(s):Yunhe PAN  Clicked:1645  Download:3232  Cited:0  <Full Text>
Frontiers of Information Technology & Electronic Engineering  2022 Vol.23 No.9 P.1287-1289  DOI:10.1631/FITEE.2130000
4Visual recognition of cardiac pathology based on 3D parametric model reconstruction
Author(s):Jinxiao XIAO, Yansong LI, Yun TIAN...  Clicked:1801  Download:5319  Cited:0  <Full Text>  <PPT> 318
Frontiers of Information Technology & Electronic Engineering  2022 Vol.23 No.9 P.1324-1337  DOI:10.1631/FITEE.2200102
5Visual knowledge guided intelligent generation of Chinese seal carving
Author(s):Kejun ZHANG, Rui ZHANG, Yehang YIN...  Clicked:4999  Download:8753  Cited:0  <Full Text>  <PPT> 315
Frontiers of Information Technology & Electronic Engineering  2022 Vol.23 No.10 P.1479-1493  DOI:10.1631/FITEE.2100094
6A knowledge-guided and traditional Chinese medicine informed approach for herb recommendation
Author(s):Zhe JIN, Yin ZHANG, Jiaxu MIAO, Yi...  Clicked:978  Download:3715  Cited:0  <Full Text>  <PPT> 179
Frontiers of Information Technology & Electronic Engineering  2023 Vol.24 No.10 P.1416-1429  DOI:10.1631/FITEE.2200662
7Visual knowledge in the big model era: Retrospect and prospect
Author(s):Wenguan WANG, Yi YANG, Yunhe PAN  Clicked:82  Download:73  Cited:0  <Full Text>
Frontiers of Information Technology & Electronic Engineering  1998 Vol.-1 No.-1 P.  DOI:10.1631/FITEE.2400250
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