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CLC number: TP391.7;TM13
On-line Access: 2024-08-27
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Inversion of thicknesses of multi-layered structures from eddy current testing measurements
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HUANG Ping-jie, WU Zhao-tong. Inversion of thicknesses of multi-layered structures from eddy current testing measurements[J]. Journal of Zhejiang University Science A, 2004, 5(1): 86-91.
@article{title="Inversion of thicknesses of multi-layered structures from eddy current testing measurements",
author="HUANG Ping-jie, WU Zhao-tong",
journal="Journal of Zhejiang University Science A",
volume="5",
number="1",
pages="86-91",
year="2004",
publisher="Zhejiang University Press & Springer",
doi="10.1631/jzus.2004.0086"
}
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%T Inversion of thicknesses of multi-layered structures from eddy current testing measurements
%A HUANG Ping-jie
%A WU Zhao-tong
%J Journal of Zhejiang University SCIENCE A
%V 5
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%P 86-91
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%I Zhejiang University Press & Springer
%DOI 10.1631/jzus.2004.0086
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T1 - Inversion of thicknesses of multi-layered structures from eddy current testing measurements
A1 - HUANG Ping-jie
A1 - WU Zhao-tong
J0 - Journal of Zhejiang University Science A
VL - 5
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SP - 86
EP - 91
%@ 1869-1951
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PB - Zhejiang University Press & Springer
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DOI - 10.1631/jzus.2004.0086
Abstract: Luquire et al.'s impedance change model of a rectangular cross section probe coil above a structure with an arbitrary number of parallel layers was used to study the principle of measuring thicknesses of multi-layered structures in terms of eddy current testing voltage measurements. An experimental system for multi-layered thickness measurement was developed and several fitting models to formulate the relationships between detected impedance/voltage measurements and thickness are put forward using least square method. The determination of multi-layered thicknesses was investigated after inversing the voltage outputs of the detecting system. The best fitting and inversion models are presented.
[1] American Society for Nondestructive Testing, 1998. Nondestructive Testing Handbook, Electromagnetic, Edition 4.
[2] Cheng, C.C., Dodd, C.V. and Deeds, W.E., 1971. General analysis of probe coils near stratified conductors. Int. J. Nondestr. Test, 3:109-130.
[3] Huang, P.J. and Wu, Z.T., 2002. Thickness measurement of multi-layered structure by eddy current testing. Proceedings of ISIST'2002, The Press in Harbin Insititute of Technology, Harbin, 5:38-42.
[4] Luquire, J.W., Deeds, W.E. and Dodd, C.V., 1970. Alternating current distribution between planar conductors. Journal of Applied Physics, 41(10):3983-3991.
[5] Oystein, B., 1993. Model-based inversion of plate thickness and liftoff from eddy current probe coil measurements. Materials Evaluation, Jan:72-76.
[6] Rekanos, I.T., Theodoulidis, T.P., Panas, S.M., Tsiboukis,T.D., 1997. Impedance inversion in eddy current testing of layered planar structures via neural networks. NDT&E International, 30(2):69-74.
[7] Wu, Z.T., and Huang, P.J., 2002. Impedance Model Simulation and Verification of Thickness Multi-layered Structure Measurement using Eddy Current Method. Proceedings of the 4th Symposium on Metrological Science and Technology, Taiwan, c11:1-7.
[8] Yan, R.C., 1996. Thickness measurement using eddy current method. Nondestructive Testing, 18(6):169-172.
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