Journal of Zhejiang University SCIENCE C 1998 Vol.-1 No.-1 P.

http://doi.org/10.1631/ENG.ITEE.2025.0156


A hybrid redundancy and serialization fault-tolerant architecture for through-silicon via interconnects


Author(s):  Chenglong SUN1,2, Yanqing ZHOU1,2, Qi WANG3*, Yan ZHANG1,2

Affiliation(s):  1. 1School of Computer and Information Engineering, Fuyang Normal University, Fuyang 236037, China 2Anhui Engineering Research Center for Intelligent Computing and Information Innovation, Fuyang Normal University, Fuyang 236037, China 3School of Computer Science and Information Engineering, Hefei University of Technology, Hefei 230601, China

Corresponding email(s):   Qi WANG, wq_hfut@163.com

Key Words:  Three-dimensional network-on-chip (3D NoC), Through-silicon vias (TSVs), Redundancy, Fault tolerance


Share this article to: More <<< Previous Article|

Chenglong SUN1,2, Yanqing ZHOU1,2, Qi WANG3*, Yan ZHANG1,2. A hybrid redundancy and serialization fault-tolerant architecture for through-silicon via interconnects[J]. Journal of Zhejiang University Science C, 1998, -1(-1): .

@article{title="A hybrid redundancy and serialization fault-tolerant architecture for through-silicon via interconnects",
author="Chenglong SUN1,2, Yanqing ZHOU1,2, Qi WANG3*, Yan ZHANG1,2",
journal="Journal of Zhejiang University Science C",
volume="-1",
number="-1",
pages="",
year="1998",
publisher="Zhejiang University Press & Springer",
doi="10.1631/ENG.ITEE.2025.0156"
}

%0 Journal Article
%T A hybrid redundancy and serialization fault-tolerant architecture for through-silicon via interconnects
%A Chenglong SUN1
%A
2
%A Yanqing ZHOU1
%A
2
%A Qi WANG3*
%A Yan ZHANG1
%A
2
%J Journal of Zhejiang University SCIENCE C
%V -1
%N -1
%P
%@ 1869-1951
%D 1998
%I Zhejiang University Press & Springer
%DOI 10.1631/ENG.ITEE.2025.0156

TY - JOUR
T1 - A hybrid redundancy and serialization fault-tolerant architecture for through-silicon via interconnects
A1 - Chenglong SUN1
A1 -
2
A1 - Yanqing ZHOU1
A1 -
2
A1 - Qi WANG3*
A1 - Yan ZHANG1
A1 -
2
J0 - Journal of Zhejiang University Science C
VL - -1
IS - -1
SP -
EP - 0
%@ 1869-1951
Y1 - 1998
PB - Zhejiang University Press & Springer
ER -
DOI - 10.1631/ENG.ITEE.2025.0156


Abstract: 
Three-dimensional network-on-chips (3D NoCs) are increasingly used to improve scalability in multicore systems. Through-silicon vias (TSVs) are a critical technology for enabling vertical interconnects between NoC layers. However, TSV-based interlayer connections are highly prone to faults resulting from manufacturing defects, aging, or other sources, which compromise system reliability. To address these challenges, particularly in chiplet-based 3D NoCs, robust fault-tolerant mechanisms are crucial for maintaining operational integrity in the presence of TSV faults. We introduce a novel fault-tolerant architecture designed to ensure persistent communication reliability despite permanent vertical link failures, named HyRAS, a hybrid redundancy and serialization method. Our approach is built on two synergistic mechanisms. First, a lightweight spatial redundancy scheme leverages shared TSV resources to mitigate the impact of isolated faults. Second, for more severe fault scenarios, an adaptive serialization strategy is employed to maintain connectivity by efficiently using the remaining functional links. The architecture is rigorously evaluated through functional simulations using both synthetic traffic patterns and realistic application workloads. Compared to contemporary fault-tolerant methods, HyRAS achieves up to 28.2% higher throughput under realistic workloads with significant defect clusters.These gains are achieved with only modest overhead, incurring a 14.52% increase in area and 8.86% in power consumption relative to the standard redundancy-based router.

Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article

Open peer comments: Debate/Discuss/Question/Opinion

<1>

Please provide your name, email address and a comment





Full Text:   <3>

CLC number: 

On-line Access: 2026-05-07

Received: 2025-11-26

Revision Accepted: 2026-04-15

Crosschecked: 0000-00-00

Cited: 0

Clicked: 24

Citations:  Bibtex RefMan EndNote GB/T7714

Journal of Zhejiang University-SCIENCE, 38 Zheda Road, Hangzhou 310027, China
Tel: +86-571-87952783; E-mail: cjzhang@zju.edu.cn
Copyright © 2000 - 2026 Journal of Zhejiang University-SCIENCE