CLC number: O484.3
On-line Access: 2024-08-27
Received: 2023-10-17
Revision Accepted: 2024-05-08
Crosschecked: 0000-00-00
Cited: 0
Clicked: 4445
XIA A-gen, YE Jian-ting, YE Quan-lin, TAO Xiang-ming, JIN Jin-sheng, YE Gao-xiang. ANOMALOUS HOPPING AND TUNNELING EFFECTS IN A NEW ALUMINUM FILM PERCOLATION SYSTEM[J]. Journal of Zhejiang University Science A, 2001, 2(4): 379-383.
@article{title="ANOMALOUS HOPPING AND TUNNELING EFFECTS IN A NEW ALUMINUM FILM PERCOLATION SYSTEM",
author="XIA A-gen, YE Jian-ting, YE Quan-lin, TAO Xiang-ming, JIN Jin-sheng, YE Gao-xiang",
journal="Journal of Zhejiang University Science A",
volume="2",
number="4",
pages="379-383",
year="2001",
publisher="Zhejiang University Press & Springer",
doi="10.1631/jzus.2001.0379"
}
%0 Journal Article
%T ANOMALOUS HOPPING AND TUNNELING EFFECTS IN A NEW ALUMINUM FILM PERCOLATION SYSTEM
%A XIA A-gen
%A YE Jian-ting
%A YE Quan-lin
%A TAO Xiang-ming
%A JIN Jin-sheng
%A YE Gao-xiang
%J Journal of Zhejiang University SCIENCE A
%V 2
%N 4
%P 379-383
%@ 1869-1951
%D 2001
%I Zhejiang University Press & Springer
%DOI 10.1631/jzus.2001.0379
TY - JOUR
T1 - ANOMALOUS HOPPING AND TUNNELING EFFECTS IN A NEW ALUMINUM FILM PERCOLATION SYSTEM
A1 - XIA A-gen
A1 - YE Jian-ting
A1 - YE Quan-lin
A1 - TAO Xiang-ming
A1 - JIN Jin-sheng
A1 - YE Gao-xiang
J0 - Journal of Zhejiang University Science A
VL - 2
IS - 4
SP - 379
EP - 383
%@ 1869-1951
Y1 - 2001
PB - Zhejiang University Press & Springer
ER -
DOI - 10.1631/jzus.2001.0379
Abstract: A new aluminum thin film percolation system, deposited on glass and silicon wafer surfaces by a vapor deposition method, was investigated. By using the expansive and mobile behaviors of the silicone oil, the Al films are quenched gradually by the silicone oil during the deposition process, The R-I behavior of the film system was studied, and the anomalous conductivity indicated that, at very low current, the hopping and tunneling effects in the films are much stronger than those of the normal film systems.
[1] Dubson, M. A., Hui, Y. C., Weissman, M. B. et al, 1989.Measurement of the fourth moment of the current distribution in two-dimensional random resistor networks. Phys. Rev. B39:6807.
[2] Haus, J. W., Kehr, K. W., 1987. Diffusion in regular and disordered lattices. Phys. Rep., 150: 263.
[3] Song, Y., Lee, S. I., Gaines, J. R., 1992. ac conduction and 1/f noise in a Cr-film lattice-percolation system.Phys. Rev., B46: 14.
[4] Yagil, Y., Deutseher, G., Bergman,D.J., 1992. Electric Breakdown Measurement of Semicontinuous Metal Film. Phys. Rev. Lett., 69:1423.
[5] Yang Bo, Luo, Mengbo, Tao Xiangming et al., 1999. Aggregation characteristics of silver atoms deposited on liquid substrates. Acta Physica Sinica., 48: 1523(in Chinese).
[6] Ye Gaoxiang, Xu Yuqing, Wang Jingsong et al., 1994a. Critical behaiviors in a Pt-film percolation system deposited on fracture surfaces of α-A12O3 ceramics. Phys.Rev. B49:3020.
[7] Ye Gaoxiang, Wang Jingsong, Xu Yuqing et al., 1994b.Evidence of anomalous hopping and tunneling effects on the conductivity of a fractal Pt-film system. Phys. Rev.B, 50:13163.
[8] Ye Gaoxiang, Xu Yuqing, Ge Hongliang et al., 1995. Conductivity and dielectric constant in a wedge-shaped Ptfilm percolation system. Phys. Lett. A, 198:251.
[9] Ye Gaoxiang, Zhang Qimi, Feng Chunmu et al. 1996. Structural and electric properties of a metallic roughthin-film system deposited on liquid substrates. Phys. Rev. B54:14754.
[10] Ye Gaoxiang, Yang Bo, Xia Ageng et al., 1998a. Fractal Ag-aggregates on silicone oil snrfaces. Acta Physica Sinica. 47:1900(in Chinese).
[11] Ye Gaoxiang, Michely, Th., Weidenhof, V. et al., 1998b. Nucleation, growth and aggregation of Ag cluster on liquid surfaces. Phys. Rev. Lett., 81:622.
[12] Zhang Qirui, Feng Chunmu et al., 1996. Conductivity measurements of a metallic diffuse-fringe film percolation system. Phys. Stat. Sol. A, 157:49.
Open peer comments: Debate/Discuss/Question/Opinion
<1>