Deep search:Searching for "fault evolution-test dependency model "FETDM"" in 'ABSTRACTGot 1 item.
index Title
1
Author(s):Xiao-dong Tan, Jian-lu Luo, Qing L...  Clicked:6950  Download:3013  Cited:0  <Full Text>  <PPT> 1949
Frontiers of Information Technology & Electronic Engineering  2015 Vol.16 No.10 P.848-857  DOI:10.1631/FITEE.1500011
Journal of Zhejiang University-SCIENCE, 38 Zheda Road, Hangzhou 310027, China
Tel: +86-571-87952783; E-mail: cjzhang@zju.edu.cn
Copyright © 2000 - 2024 Journal of Zhejiang University-SCIENCE