| index | Title |
| 1 | Binary neural networks for speech recognition Author(s):Yan-min Qian, Xu Xiang Clicked:9103 Download:4794 Cited:0 <Full Text> <PPT> 2839 Frontiers of Information Technology & Electronic Engineering 2019 Vol.20 No.5 P.701-715 DOI:10.1631/FITEE.1800469 |
| 2 | Multi-exit self-distillation with appropriate teachers Author(s):Wujie SUN, Defang CHEN, Can WANG, ... Clicked:4648 Download:4411 Cited:0 <Full Text> <PPT> 1247 Frontiers of Information Technology & Electronic Engineering 2024 Vol.25 No.4 P.585-599 DOI:10.1631/FITEE.2200644 |
| 3 | Federated learning on non-IID and long-tailed data via dual-decoupling Author(s):Zhaohui WANG, Hongjiao LI, Jinguo ... Clicked:5037 Download:4730 Cited:0 <Full Text> <PPT> 1381 Frontiers of Information Technology & Electronic Engineering 2024 Vol.25 No.5 P.728-741 DOI:10.1631/FITEE.2300284 |
| 4 | Federated mutual learning: a collaborative machine learning method for heterogeneous data, models, and obje... Author(s):Tao SHEN, Jie ZHANG, Xinkang JIA, ... Clicked:4152 Download:6807 Cited:0 <Full Text> <PPT> 1632 Frontiers of Information Technology & Electronic Engineering 2023 Vol.24 No.10 P.1390-1402 DOI:10.1631/FITEE.2300098 |
| 5 | TendiffPure: a convolutional tensor-train denoising diffusion model for purification Author(s):Mingyuan BAI, Derun ZHOU, Qibin ZHAO Clicked:4074 Download:4128 Cited:0 <Full Text> <PPT> 2039 Frontiers of Information Technology & Electronic Engineering 2024 Vol.25 No.1 P.160-169 DOI:10.1631/FITEE.2300392 |
| 6 | Prototype-guided cross-task knowledge distillation Author(s):Deng LI, Peng LI, Aming WU, Yahong... Clicked:3188 Download:8379 Cited:0 <Full Text> <PPT> 1219 Frontiers of Information Technology & Electronic Engineering 2025 Vol.26 No.6 P.912-929 DOI:10.1631/FITEE.2400383 |
| 7 | Knowledge distillation for financial large language models: a systematic review of strategies, applications... Author(s):Jiaqi SHI, Xulong ZHANG, Xiaoyang ... Clicked:3344 Download:1050 Cited:0 <Full Text> <PPT> 762 Frontiers of Information Technology & Electronic Engineering 2025 Vol.26 No.10 P.1793-1808 DOI:10.1631/FITEE.2500282 |