| index | Title |
| 1 | Study on the instantaneous protection reliability of low voltage circuit breakers Author(s):LU Jian-guo, DU Tai-hang, LUO Yan-... Clicked:8147 Download:4267 Cited:1 <Full Text> Journal of Zhejiang University Science A 2007 Vol.8 No.3 P.370-377 DOI:10.1631/jzus.2007.A0370 |
| 2 | Study on the failure mechanism of Ag-Ce contacts in DC level Author(s):MENG Fan-bin, LU Jian-guo, LU Ning... Clicked:7239 Download:3895 Cited:0 <Full Text> Journal of Zhejiang University Science A 2007 Vol.8 No.3 P.449-452 DOI:10.1631/jzus.2007.A0449 |
| 3 | Research on the overload protection reliability of moulded case circuit-breakers and its test device Author(s):LI Kui, LU Jian-guo, WU Yi, QIN Zh... Clicked:7680 Download:3607 Cited:1 <Full Text> Journal of Zhejiang University Science A 2007 Vol.8 No.3 P.453-458 DOI:10.1631/jzus.2007.A0453 |
| 4 | Application of the Bayes’ theory to the failure rate evaluation of electrical apparatus Author(s):JIN Shao-hua, LU Jian-guo, WAN Yan... Clicked:7198 Download:3855 Cited:2 <Full Text> Journal of Zhejiang University Science A 2007 Vol.8 No.3 P.501-505 DOI:10.1631/jzus.2007.A0501 |