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index	Title
1	Effective fault detection in 3D ICs: cluster-based BIST for enhanced inter-layer via fault coverage Author(s):Hadi JAHANIRAD1, Ahmad ...  Clicked:3  Download:1  Cited:0  <Full Text> Frontiers of Information Technology & Electronic Engineering  1998 Vol.-1 No.-1 P.  DOI:10.1631/FITEE.2401094

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