| index | Title |
| 1 | Long working distance portable smartphone microscopy for metallic mesh defect detection Author(s):Zhengang LU, Hongsheng QIN, Jing L... Clicked:2018 Download:2993 Cited:0 <Full Text> <PPT> 527 Frontiers of Information Technology & Electronic Engineering 2025 Vol.26 No.7 P.1131-1143 DOI:10.1631/FITEE.2401002 |