| index | Title |
| 1 | An accurate analytical I-V model for sub-90-nm MOSFETs and its application to read static noi... Author(s):Behrouz Afzal, Behzad Ebrahimi, Al... Clicked:11562 Download:5306 Cited:3 <Full Text> Journal of Zhejiang University Science C 2012 Vol.13 No.1 P.58-70 DOI:10.1631/jzus.C1100090 |
| 2 | High-performance low-leakage regions of nano-scaled CMOS digital gates under variations of threshold voltag... Author(s):Hossein Aghababa, Behjat Forouzand... Clicked:10319 Download:4403 Cited:3 <Full Text> Journal of Zhejiang University Science C 2012 Vol.13 No.6 P.460-471 DOI:10.1631/jzus.C1100273 |
| 3 | Multi-stage dual replica bit-line delay technique for process-variation-robust timing of low voltage SRAM s... Author(s):Shou-biao Tan, Wen-juan Lu, Chun-y... Clicked:10013 Download:5294 Cited:1 <Full Text> <PPT> 2715 Frontiers of Information Technology & Electronic Engineering 2015 Vol.16 No.8 P.700-706 DOI:10.1631/FITEE.1400439 |