Deep search:Searching for "Large language model" in 'KEYWORDGot 7 items.
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1Four development stages of collective intelligence
Author(s):Renbin XIAO  Clicked:2185  Download:4297  Cited:0  <Full Text>  <PPT> 683
Frontiers of Information Technology & Electronic Engineering  2024 Vol.25 No.7 P.903-916  DOI:10.1631/FITEE.2300459
2Memory-efficient tensor parallelism for long-sequence Transformer training
Author(s):Peng LIANG, Linbo QIAO, Yanqi SHI,...  Clicked:789  Download:1648  Cited:0  <Full Text>  <PPT> 454
Frontiers of Information Technology & Electronic Engineering  2025 Vol.26 No.5 P.770-787  DOI:10.1631/FITEE.2400602
3Building accurate translation-tailored large language models with language-aware instruction tuning
Author(s):Changtong ZAN, Liang DING, Li SHEN...  Clicked:1872  Download:2531  Cited:0  <Full Text>  <PPT> 385
Frontiers of Information Technology & Electronic Engineering  2025 Vol.26 No.8 P.1341-1355  DOI:10.1631/FITEE.2400458
4FinSphere: a real-time stock analysis agent with instruction-tuned large language models and domain-specifi...
Author(s):Shijie HAN, Jingshu ZHANG, Yiqing ...  Clicked:506  Download:342  Cited:0  <Full Text>  <PPT> 100
Frontiers of Information Technology & Electronic Engineering  2025 Vol.26 No.10 P.1822-1831  DOI:10.1631/FITEE.2500414
5Can large language models effectively process and execute financial trading instructions?
Author(s):Yu KANG, Xin YANG, Ge WANG, Yuda W...  Clicked:497  Download:383  Cited:0  <Full Text>
Frontiers of Information Technology & Electronic Engineering  2025 Vol.26 No.10 P.1832-1846  DOI:10.1631/FITEE.2500285
6Large investment model
Author(s):Jian GUO, Heung-Yeung SHUM  Clicked:569  Download:973  Cited:0  <Full Text>  <PPT> 96
Frontiers of Information Technology & Electronic Engineering  2025 Vol.26 No.10 P.1771-1792  DOI:10.1631/FITEE.2500268
7Eix âo-UAM: LLM-assisted iterative design of a low-altitude urban air mobility corridor in Brasilia
Author(s):Li WEIGANG1, Juliano Ad...  Clicked:183  Download:119  Cited:0  <Full Text>
Frontiers of Information Technology & Electronic Engineering  1998 Vol.-1 No.-1 P.  DOI:10.1631/FITEE.2500541
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