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index	Title
1	Long working distance portable smartphone microscopy for metallic mesh defect detection Author(s):Zhengang LU, Hongsheng QIN, Jing L...  Clicked:663  Download:799  Cited:0  <Full Text>  <PPT> 70 Frontiers of Information Technology & Electronic Engineering  2025 Vol.26 No.7 P.1131-1143  DOI:10.1631/FITEE.2401002

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