Deep search:Searching for "Inter symbol interference "ISI"" in 'KEYWORD Got 10 items.
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1
Author(s):ZHANG Zhao-yang, LAI Li-feng  Clicked:7003  Download:3505  Cited:10  <Full Text>
Journal of Zhejiang University Science  2004 Vol.5 No.11 P.1336-1342  DOI:10.1631/jzus.2004.1336
2
Author(s):JIN Xiao-dong, ZHAO Min-jian, SUN ...  Clicked:5606  Download:3423  Cited:0  <Full Text>
Journal of Zhejiang University Science A  2007 Vol.8 No.12 P.1884-1888  DOI:10.1631/jzus.2007.A1884
3
Author(s):Min-jian ZHAO, Di ZHANG, Bin CAI  Clicked:6333  Download:3358  Cited:0  <Full Text>
Journal of Zhejiang University Science A  2008 Vol.9 No.12 P.1676-1684  DOI:10.1631/jzus.A0820086
4
Author(s):Li-na Zhang, Yun-mei Yang, Zhe-ron...  Clicked:6038  Download:3025  Cited:8  <Full Text>
Journal of Zhejiang University Science B  2010 Vol.11 No.9 P.681-689  DOI:10.1631/jzus.B1000132
5
Author(s):Ning Zhou, Wei-xing Chen, Wei Zhan...  Clicked:6449  Download:2887  Cited:1  <Full Text>
Journal of Zhejiang University Science B  2010 Vol.11 No.9 P.690-701  DOI:10.1631/jzus.B1000008
6
Author(s):Ya-e Zhao, Li Hu, Li-ping Wu, Jun-...  Clicked:9912  Download:4645  Cited:17  <Full Text>
Journal of Zhejiang University Science B  2012 Vol.13 No.3 P.192-202  DOI:10.1631/jzus.B1100285
7
Author(s):Xiao-fen He, Jun-jun Wei, Sheng-yu...  Clicked:4982  Download:2672  Cited:0  <Full Text>  <PPT> 1969
Journal of Zhejiang University Science B  2017 Vol.18 No.3 P.239-248  DOI:10.1631/jzus.B1600247
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Author(s):Sandeep Sarowa, Harmanjeet Singh, ...  Clicked:9448  Download:2733  Cited:0  <Full Text>  <PPT> 2057
Frontiers of Information Technology & Electronic Engineering  2017 Vol.18 No.11 P.1892-1899  DOI:10.1631/FITEE.1601333
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Author(s):Jian-zhi Li, Bo Ai, Rui-si He, Qi ...  Clicked:11695  Download:4876  Cited:1  <Full Text>  <PPT> 4151
Frontiers of Information Technology & Electronic Engineering  2017 Vol.18 No.6 P.773-787  DOI:10.1631/FITEE.1700021
10
Author(s):Haiquan LU, Yong ZENG  Clicked:440  Download:209  Cited:0  <Full Text>
Frontiers of Information Technology & Electronic Engineering  1998 Vol.-1 No.-1 P.  DOI:10.1631/FITEE.2400271
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