| index | Title |
| 691 | Data-driven intermittent connection fault diagnosis for complex topology DeviceNet based on Bayesian inference Author(s):Longkai WANG, Yong LEI Clicked:2526 Download:4357 Cited:0 <Full Text> <PPT> 532 Frontiers of Information Technology & Electronic Engineering 2025 Vol.26 No.7 P.1194-1208 DOI:10.1631/FITEE.2400696 |
| 692 | query error! |
