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CLC number: O439

On-line Access: 2017-09-08

Received: 2015-12-28

Revision Accepted: 2016-04-11

Crosschecked: 2017-08-14

Cited: 1

Clicked: 4431

Citations:  Bibtex RefMan EndNote GB/T7714

 ORCID:

Jian Hao

http://orcid.org/0000-0002-2419-25083

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Frontiers of Information Technology & Electronic Engineering  2017 Vol.18 No.8 P.1197-1204

http://doi.org/10.1631/FITEE.1500483


Determination of cut-off time of accelerated aging test under temperature stress for LED lamps


Author(s):  Jian Hao, Lei Jing, Hong-liang Ke, Yao Wang, Qun Gao, Xiao-xun Wang, Qiang Sun, Zhi-jun Xu

Affiliation(s):  University of Chinese Academy of Sciences, Beijing 100049, China; more

Corresponding email(s):   sunq@ciomp.ac.cn

Key Words:  LED lamp, Accelerated aging test, Medium lifetime, Moving average error


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Jian Hao, Lei Jing, Hong-liang Ke, Yao Wang, Qun Gao, Xiao-xun Wang, Qiang Sun, Zhi-jun Xu. Determination of cut-off time of accelerated aging test under temperature stress for LED lamps[J]. Frontiers of Information Technology & Electronic Engineering, 2017, 18(8): 1197-1204.

@article{title="Determination of cut-off time of accelerated aging test under temperature stress for LED lamps",
author="Jian Hao, Lei Jing, Hong-liang Ke, Yao Wang, Qun Gao, Xiao-xun Wang, Qiang Sun, Zhi-jun Xu",
journal="Frontiers of Information Technology & Electronic Engineering",
volume="18",
number="8",
pages="1197-1204",
year="2017",
publisher="Zhejiang University Press & Springer",
doi="10.1631/FITEE.1500483"
}

%0 Journal Article
%T Determination of cut-off time of accelerated aging test under temperature stress for LED lamps
%A Jian Hao
%A Lei Jing
%A Hong-liang Ke
%A Yao Wang
%A Qun Gao
%A Xiao-xun Wang
%A Qiang Sun
%A Zhi-jun Xu
%J Frontiers of Information Technology & Electronic Engineering
%V 18
%N 8
%P 1197-1204
%@ 2095-9184
%D 2017
%I Zhejiang University Press & Springer
%DOI 10.1631/FITEE.1500483

TY - JOUR
T1 - Determination of cut-off time of accelerated aging test under temperature stress for LED lamps
A1 - Jian Hao
A1 - Lei Jing
A1 - Hong-liang Ke
A1 - Yao Wang
A1 - Qun Gao
A1 - Xiao-xun Wang
A1 - Qiang Sun
A1 - Zhi-jun Xu
J0 - Frontiers of Information Technology & Electronic Engineering
VL - 18
IS - 8
SP - 1197
EP - 1204
%@ 2095-9184
Y1 - 2017
PB - Zhejiang University Press & Springer
ER -
DOI - 10.1631/FITEE.1500483


Abstract: 
To acquire a rational minimum cut-off time and the precision of lifetime prediction with respect to cut-off time for the accelerated aging test of LED lamps, fifth-order moving average error estimation is adopted in this paper. Eighteen LED lamps from the same batch are selected for two accelerated aging tests, with 10 samples at 80 °C and eight samples at 85 °C. First, the accelerated lifetime of each lamp is acquired by exponential fitting of the lumen maintenances of the lamp for a certain cut-off time. With the acquired lifetimes of all lamps, the two-parameter Weibull distribution of the failure probability is obtained, and the medium lifetime is calculated. Then, the precision of the medium lifetime prediction for different cut-off times is obtained by moving average error estimation. It is shown that there exists a minimum cut-off time for the accelerated aging test, which can be determined by the variation of the moving average error versus the cut-off time. When the cut-off time is less than this value, the lifetime estimation is irrational. For a given cut-off time, the precision of lifetime prediction can be computed by average error evaluation, and the error of lifetime estimation decreases gradually as the cut-off time increases. The minimum cut-off time and medium lifetime of LED lamps are both sensitive to thermal stress. The minimum cut-off time is 1104 h with the lifetime estimation error of 1.15% for the test at 80 °C, and 936 h with the lifetime estimation error of 1.24% for the test at 85 °C. With the lifetime estimation error of about 0.46%, the median lifetimes are 7310 h and 4598 h for the tests at 80 °C and 85°C, respectively.

This article has been corrected, see doi:10.1631/FITEE.15e0483

LED灯具温度应力加速老化截止时间的确定

概要:在LED灯具加速老化过程中,为获得最小截止时间,对其寿命进行快速预估,本文采用5阶滑动平均误差方法分析数据。选用同批次的16个样本,分别进行80°C和85°C应力条件下的加速老化。首先,采用e指数对光通维持率进行拟合,获得每个灯具的加速寿命,进而采用威布尔分布对加速寿命进行拟合,获得中位寿命。其次,采用平均滑动误差方法,可获取不同截止时间下中位寿命预估误差。结果表明:加速老化过程中,存在最小截止时间,该时间可通过滑动平均误差和截止时间的关系确定;当截止时间小于该值时,寿命预估不合理;寿命预估误差随截止时间增加而逐渐减小。对于该类LED灯具,80℃时最小截止时间为1104小时,寿命预估误差为1.15%;85°C时最小截止时间为936小时,寿命预估误差为1.24%。当寿命估计误差约为0.46%时,80°C和85°C对应的中位寿命分别为7310小时和4598小时。

关键词:LED灯具;加速老化测试;中位寿命;滑动平均误差

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