Full Text:   <1975>

CLC number: O484

On-line Access: 

Received: 2000-12-19

Revision Accepted: 2001-02-28

Crosschecked: 0000-00-00

Cited: 0

Clicked: 4058

Citations:  Bibtex RefMan EndNote GB/T7714

-   Go to

Article info.
1. Reference List
Open peer comments

Journal of Zhejiang University SCIENCE A 2001 Vol.2 No.4 P.384-387

http://doi.org/10.1631/jzus.2001.0384


SURFACE MORPHOLOGIES OF ALUMINUM FILMS ON SILICONE OIL SURFACES


Author(s):  JIN Jin-sheng

Affiliation(s):  Department of Physics, Zhejiang University, Hangzhou 310028, China

Corresponding email(s): 

Key Words:  surface morphology, growth mechanism, liquid substrate, aluminum(AI)


Share this article to: More

JIN Jin-sheng. SURFACE MORPHOLOGIES OF ALUMINUM FILMS ON SILICONE OIL SURFACES[J]. Journal of Zhejiang University Science A, 2001, 2(4): 384-387.

@article{title="SURFACE MORPHOLOGIES OF ALUMINUM FILMS ON SILICONE OIL SURFACES",
author="JIN Jin-sheng",
journal="Journal of Zhejiang University Science A",
volume="2",
number="4",
pages="384-387",
year="2001",
publisher="Zhejiang University Press & Springer",
doi="10.1631/jzus.2001.0384"
}

%0 Journal Article
%T SURFACE MORPHOLOGIES OF ALUMINUM FILMS ON SILICONE OIL SURFACES
%A JIN Jin-sheng
%J Journal of Zhejiang University SCIENCE A
%V 2
%N 4
%P 384-387
%@ 1869-1951
%D 2001
%I Zhejiang University Press & Springer
%DOI 10.1631/jzus.2001.0384

TY - JOUR
T1 - SURFACE MORPHOLOGIES OF ALUMINUM FILMS ON SILICONE OIL SURFACES
A1 - JIN Jin-sheng
J0 - Journal of Zhejiang University Science A
VL - 2
IS - 4
SP - 384
EP - 387
%@ 1869-1951
Y1 - 2001
PB - Zhejiang University Press & Springer
ER -
DOI - 10.1631/jzus.2001.0384


Abstract: 
The surface morphology and growth mechanism of an aluminum film system deposited on silicone oil surfaces by a vapor depositing method was investigated by scanning electron microscopy. It was found that the perpendicular fluctuation of the film's bottom surface was more remarkable than that of the film's top surface. Near the joint between the film on the silicone oil substrate and the film on the silicon wafer surface on which the silicone oil substrate rested, was a naturally formed anomalous wedge-shaped wrinkly structure with slopes of 10-4 - 10-5 rad, whose growth mechanism could be interpretod under the assumption of the thermal expansion behavior of the liquid substrates.

Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article

Reference

[1] Haus, J. W., Kehr, K. W., 1987. Diffusion in regular and disordered lattices. Phys. Rep., 150:263.

[2] Julien, R., Kertesz, J., Meakin, P. et al., 1992. Surface disordering: growth, roughening and phase transitions. Nova Science, Commack.

[3] Krug, J., Spohn, H., 1990. Growth Morphology and Defects, In: Solids Far from Equilibrium. Cambridge Univ. Press, Cambridge.

[4] Meakin, P., 1993. The growth of rough surfaces and interfaces. Phys. Rep., 235:189.

[5] Palasantzas, G., Krim, J., 1994. Scanning tunneling microscopy study of the thick film limit of kinetic roughening. Phys. Rev. Lett., 73:3564.

[6] Williams, D. R. M., 1995. Corrugational Instabilities of Thin Copolymer Films. Phys. Rev. Lea., 75:453.

[7] Ye Gaoxiang, Zhang Qirui, Xu Yuqing et al., 1995. Third-harmonic coefficient in a Au-film percolation system deposited on fracture surfaces of α-A12O3 ceramics. Phys. Rev. B, 52:10811.

[8] Ye Gaoxiang, Zhang Qimi, Feng Chunmu ct al., 1996. Structural and electrical properties of a metallic roughthin-film system deposited on liquid substrates. Phys. Rev. B, 54:14754.

Open peer comments: Debate/Discuss/Question/Opinion

<1>

Please provide your name, email address and a comment





Journal of Zhejiang University-SCIENCE, 38 Zheda Road, Hangzhou 310027, China
Tel: +86-571-87952783; E-mail: cjzhang@zju.edu.cn
Copyright © 2000 - 2022 Journal of Zhejiang University-SCIENCE