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CLC number: TN141
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Received: 2005-01-18
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Constant-step stress accelerated life test of VFD under Weibull distribution case
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ZHANG Jian-ping, GENG Xin-min. Constant-step stress accelerated life test of VFD under Weibull distribution case[J]. Journal of Zhejiang University Science A, 2005, 6(7): 722-727.
@article{title="Constant-step stress accelerated life test of VFD under Weibull distribution case",
author="ZHANG Jian-ping, GENG Xin-min",
journal="Journal of Zhejiang University Science A",
volume="6",
number="7",
pages="722-727",
year="2005",
publisher="Zhejiang University Press & Springer",
doi="10.1631/jzus.2005.A0722"
}
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%T Constant-step stress accelerated life test of VFD under Weibull distribution case
%A ZHANG Jian-ping
%A GENG Xin-min
%J Journal of Zhejiang University SCIENCE A
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%D 2005
%I Zhejiang University Press & Springer
%DOI 10.1631/jzus.2005.A0722
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T1 - Constant-step stress accelerated life test of VFD under Weibull distribution case
A1 - ZHANG Jian-ping
A1 - GENG Xin-min
J0 - Journal of Zhejiang University Science A
VL - 6
IS - 7
SP - 722
EP - 727
%@ 1673-565X
Y1 - 2005
PB - Zhejiang University Press & Springer
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DOI - 10.1631/jzus.2005.A0722
Abstract: constant-step stress accelerated life test of vacuum Fluorescent Display (VFD) was conducted with increased cathode temperature. Statistical analysis was done by applying weibull distribution for describing the life, and Least Square Method (LSM) for estimating weibull parameters. Self-designed special software was used to predict the VFD life. Numerical results showed that the average life of VFD is over 30000 h, that the VFD life follows weibull distribution, and that the life-stress relationship satisfies linear Arrhenius equation completely. Accurate calculation of the key parameter enabled rapid estimation of VFD life.
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