| index | Title |
| 1 | An efficient prediction framework for multi-parametric yield analysis under parameter variations Author(s):Xin Li, Jin Sun, Fu Xiao Clicked:9033 Download:4306 Cited:0 <Full Text> <PPT> 2462 Frontiers of Information Technology & Electronic Engineering 2016 Vol.17 No.12 P.1344-1359 DOI:10.1631/FITEE.1601225 |
| 2 | An efficient bi-objective optimization framework for statistical chip-level yield analysis under parameter ... Author(s):Xin Li, Jin Sun, Fu Xiao, Jiang-sh... Clicked:10442 Download:4823 Cited:2 <Full Text> <PPT> 2906 Frontiers of Information Technology & Electronic Engineering 2016 Vol.17 No.2 P.160-172 DOI:10.1631/FITEE.1500168 |