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index	Title
1	Mean shift texture surface detection based on WT and COM feature image selection Author(s):HAN Yan-fang, SHI Peng-fei  Clicked:7450  Download:3714  Cited:0  <Full Text> Journal of Zhejiang University Science A  2006 Vol.7 No.6 P.969-975  DOI:10.1631/jzus.2006.A0969
2	Void defect detection in ball grid array X-ray images using a new blob filter Author(s):Shao-hu Peng, Hyun Do Nam  Clicked:8428  Download:4541  Cited:1  <Full Text> Journal of Zhejiang University Science C  2012 Vol.13 No.11 P.840-849  DOI:10.1631/jzus.C1200065
3	Catenary insulator defect detection based on contour features and gray similarity matching Author(s):Ping Tan, Xu-feng Li, Jin-mei Xu, ...  Clicked:6838  Download:3368  Cited:0  <Full Text>  <PPT> 3148 Journal of Zhejiang University Science A  2020 Vol.21 No.1 P.64-73  DOI:10.1631/jzus.A1900341
4	Spacecraft damage infrared detection algorithm for hypervelocity impact based on double-layer multi-target ... Author(s):Xiao YANG, Chun YIN, Sara DADRAS, ...  Clicked:6915  Download:11985  Cited:0  <Full Text>  <PPT> 990 Frontiers of Information Technology & Electronic Engineering  2022 Vol.23 No.4 P.571-586  DOI:10.1631/FITEE.2000695
5	Mask R-CNN and multifeature clustering model for catenary insulator recognition and defect detection Author(s):Ping TAN, Xu-feng LI, Jin DING, Zh...  Clicked:2719  Download:1533  Cited:0  <Full Text>  <PPT> 943 Journal of Zhejiang University Science A  2022 Vol.23 No.9 P.745-756  DOI:10.1631/jzus.A2100494
6	Adaptive cropping shallow attention network for defect detection of bridge girder steel using unmanned aeri... Author(s):Zonghan MU, Yong QIN, Chongchong Y...  Clicked:3267  Download:1869  Cited:0  <Full Text>  <PPT> 883 Journal of Zhejiang University Science A  2023 Vol.24 No.3 P.243-256  DOI:10.1631/jzus.A2200175
7	Long working distance portable smartphone microscopy for metallic mesh defect detection Author(s):Zhengang LU, Hongsheng QIN, Jing L...  Clicked:1166  Download:1187  Cited:0  <Full Text>  <PPT> 195 Frontiers of Information Technology & Electronic Engineering  2025 Vol.26 No.7 P.1131-1143  DOI:10.1631/FITEE.2401002

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