Deep search:Searching for "Fault-tolerance" in 'KEYWORDGot 10 items.
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1
Author(s):TANG Jing-fan, ZHOU Bo, HE Zhi-jun  Clicked:6663  Download:3336  Cited:6  <Full Text>
Journal of Zhejiang University Science A  2005 Vol.6 No.7 P.676-682  DOI:10.1631/jzus.2005.A0676
2
Author(s):GUO Hui, WANG Yun-peng, WANG Zhi-g...  Clicked:6399  Download:3288  Cited:0  <Full Text>
Journal of Zhejiang University Science A  2006 Vol.7 No.6 P.1001-1007  DOI:10.1631/jzus.2006.A1001
3
Author(s):Shervin VAKILI, Sied Mehdi FAKHRAI...  Clicked:5681  Download:3541  Cited:1  <Full Text>
Journal of Zhejiang University Science A  2009 Vol.10 No.6 P.922-926  DOI:10.1631/jzus.A0820803
4
Author(s):SONG Ping, SUN Jian-ling, HE Zhi-jun  Clicked:6539  Download:2722  Cited:0  <Full Text>
Journal of Zhejiang University Science  2004 Vol.5 No.5 P.550-557  DOI:10.1631/jzus.2004.0550
5
Author(s):Yu Zhang, Yang-ming Zheng, Mu Yang...  Clicked:8300  Download:4112  Cited:2  <Full Text>
Journal of Zhejiang University Science C  2012 Vol.13 No.2 P.83-89  DOI:10.1631/jzus.C1100079
6
Author(s):Xiao-yan Huang, Mao-jing Jin, Jian...  Clicked:8690  Download:4395  Cited:0  <Full Text>
Journal of Zhejiang University Science C  2012 Vol.13 No.11 P.866-874  DOI:10.1631/jzus.C1200164
7
Author(s):Da-min Zhang, Shi-tao Wang, Hui-pi...  Clicked:8236  Download:4785  Cited:2  <Full Text>
Journal of Zhejiang University Science C  2013 Vol.14 No.4 P.296-310  DOI:10.1631/jzus.C1200283
8
Author(s):Wei Hu, Guang-ming Liu, Yan-huang ...  Clicked:4801  Download:2322  Cited:0  <Full Text>  <PPT> 1669
Frontiers of Information Technology & Electronic Engineering  2018 Vol.19 No.10 P.1273-1290  DOI:10.1631/FITEE.1601450
9
Author(s):Ji-dong Zhai, Wen-guang Chen  Clicked:3305  Download:1999  Cited:0  <Full Text>  <PPT> 1498
Frontiers of Information Technology & Electronic Engineering  2018 Vol.19 No.10 P.1261-1266  DOI:10.1631/FITEE.1800442
10
Author(s):Jian-wen Xu, Kaoru Ota, Mian-xiong...  Clicked:5377  Download:2986  Cited:0  <Full Text>  <PPT> 1670
Frontiers of Information Technology & Electronic Engineering  2018 Vol.19 No.12 P.1546-1557  DOI:10.1631/FITEE.1800519
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