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1An efficient bi-objective optimization framework for statistical chip-level yield analysis under parameter variations
Author(s):Xin Li, Jin Sun, Fu Xiao, Jiang-shan Tian  Clicked:10145  Download:4336  Cited:2  <Full Text>  <PPT> 2841
Frontiers of Information Technology & Electronic Engineering  2016 Vol.17 No.2 P.160-172  DOI:10.1631/FITEE.1500168
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