| index | Title |
| 1 | An efficient bi-objective optimization framework for statistical chip-level yield analysis under parameter variations Author(s):Xin Li, Jin Sun, Fu Xiao, Jiang-shan Tian Clicked:10454 Download:4845 Cited:2 <Full Text> <PPT> 2911 Frontiers of Information Technology & Electronic Engineering 2016 Vol.17 No.2 P.160-172 DOI:10.1631/FITEE.1500168 |
