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Received: 2007-12-17
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A recoverable stress testing algorithm for compression and encryption cards
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Bao-jun ZHANG, Xue-zeng PAN, Jie-bing WANG, Ling-di PING. A recoverable stress testing algorithm for compression and encryption cards[J]. Journal of Zhejiang University Science A, 2008, 9(10): 1398-1405.
@article{title="A recoverable stress testing algorithm for compression and encryption cards",
author="Bao-jun ZHANG, Xue-zeng PAN, Jie-bing WANG, Ling-di PING",
journal="Journal of Zhejiang University Science A",
volume="9",
number="10",
pages="1398-1405",
year="2008",
publisher="Zhejiang University Press & Springer",
doi="10.1631/jzus.A0720130"
}
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%@ 1673-565X
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%I Zhejiang University Press & Springer
%DOI 10.1631/jzus.A0720130
TY - JOUR
T1 - A recoverable stress testing algorithm for compression and encryption cards
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J0 - Journal of Zhejiang University Science A
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DOI - 10.1631/jzus.A0720130
Abstract: This study proposes a recoverable stress testing algorithm (RSTA) for such special devices as compression/decompression card and encryption/decryption card. It uses a chaos function to generate a random sequence, and then, according to the random sequence, generates an effective command sequence. The dispatch of command obeys a special schedule strategy we designed for such devices, i.e., the commands are sent according to the command sequence, and the complete commands are put in a buffer for further result check. RSTA is used to test the HIFN compression acceleration card SAICHI-1000. Test results show that RSTA can make the card work continuously and adequately.
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