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index	Title
1	PASS: a simple, efficient parallelism-aware solid state drive I/O scheduler Author(s):Hong-yan Li, Nai-xue Xiong, Ping H...  Clicked:8156  Download:4166  Cited:0  <Full Text>  <PPT> 2146 Journal of Zhejiang University Science C  2014 Vol.15 No.5 P.321-336  DOI:10.1631/jzus.C1300258
2	Fine-grained checkpoint based on non-volatile memory Author(s):Wen-zhe Zhang, Kai Lu, Mikel LUJÁN...  Clicked:7232  Download:2641  Cited:0  <Full Text>  <PPT> 1779 Frontiers of Information Technology & Electronic Engineering  2017 Vol.18 No.2 P.220-234  DOI:10.1631/FITEE.1500352
3	A novel non-volatile memory storage system for I/O-intensive applications Author(s):Wen-bing Han, Xiao-gang Chen, Shun...  Clicked:4365  Download:2526  Cited:0  <Full Text>  <PPT> 1796 Frontiers of Information Technology & Electronic Engineering  2018 Vol.19 No.10 P.1291-1302  DOI:10.1631/FITEE.1700061
4	Enhancing security of NVM-based main memory with dynamic Feistel network mapping Author(s):Fang-ting Huang, Dan Feng, Wen Xia...  Clicked:6989  Download:2885  Cited:0  <Full Text>  <PPT> 1983 Frontiers of Information Technology & Electronic Engineering  2018 Vol.19 No.7 P.847-863  DOI:10.1631/FITEE.1601652
5	NEHASH: high-concurrency extendible hashing for non-volatile memory Author(s):Tao CAI, Pengfei GAO, Dejiao NIU, ...  Clicked:1949  Download:2531  Cited:0  <Full Text>  <PPT> 375 Frontiers of Information Technology & Electronic Engineering  2023 Vol.24 No.5 P.703-715  DOI:10.1631/FITEE.2200462
6	&"href="./article.php?doi=10.1631/FITEE.2200456" target="_blank">SoftSSD: enabling rapid flash firmware prototyping for solid-state drives Author(s):Jin XUE, Renhai CHEN, Tianyu WANG,...  Clicked:1929  Download:5087  Cited:0  <Full Text>  <PPT> 425 Frontiers of Information Technology & Electronic Engineering  2023 Vol.24 No.5 P.659-674  DOI:10.1631/FITEE.2200456
7	MyWAL: performance optimization by removing redundant input/output stack in key-value store Author(s):Xiao ZHANG, Mengyu LI, Michael NGU...  Clicked:1398  Download:1664  Cited:0  <Full Text>  <PPT> 442 Frontiers of Information Technology & Electronic Engineering  2023 Vol.24 No.7 P.980-993  DOI:10.1631/FITEE.2200496

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