| index | Title |
| 1 | Large eddy simulation for wind field analysis based on stabilized finite element method Author(s):Cheng Huang, Yan Bao, Dai Zhou, Ji... Clicked:9623 Download:3794 Cited:0 <Full Text> Journal of Zhejiang University Science A 2011 Vol.12 No.4 P.278-290 DOI:10.1631/jzus.A1000114 |
| 2 | 3D analysis for pit evolution and pit-to-crack transition during corrosion fatigue Author(s):Xiao-guang Huang, Jin-quan Xu Clicked:11040 Download:5517 Cited:3 <Full Text> <PPT> 3020 Journal of Zhejiang University Science A 2013 Vol.14 No.4 P.292-299 DOI:10.1631/jzus.A1200273 |
| 3 | A nonlinear cumulative evolution model for corrosion fatigue damage Author(s):Zhong-ying Han, Xiao-guang Huang, ... Clicked:12340 Download:6290 Cited:6 <Full Text> <PPT> 3414 Journal of Zhejiang University Science A 2014 Vol.15 No.6 P.447-453 DOI:10.1631/jzus.A1300362 |
| 4 | Relationship among S-N curves corresponding to different mean stresses or stress ratios Author(s):Shan-qin Hou, Jin-quan Xu Clicked:6766 Download:6458 Cited:2 <Full Text> <PPT> 2848 Journal of Zhejiang University Science A 2015 Vol.16 No.11 P.885-893 DOI:10.1631/jzus.A1400321 |
| 5 | Periodically varied initial offset boosting behaviors in a memristive system with cosine memductance Author(s):Mo Chen, Xue Ren, Hua-gan Wu, Quan... Clicked:7465 Download:4771 Cited:0 <Full Text> <PPT> 2275 Frontiers of Information Technology & Electronic Engineering 2019 Vol.20 No.12 P.1706-1716 DOI:10.1631/FITEE.1900360 |
| 6 | A 9.8–30.1 GHz CMOS low-noise amplifier with a 3.2-dB noise figure using inductor- and transformer-ba... Author(s):Hongchen Chen, Haoshen Zhu, Liang ... Clicked:10031 Download:12161 Cited:0 <Full Text> <PPT> 2584 Frontiers of Information Technology & Electronic Engineering 2021 Vol.22 No.4 P.586-598 DOI:10.1631/FITEE.2000510 |
| 7 | Initial-condition-switched boosting extreme multistability and mechanism analysis in a memcapacitive oscill... Author(s):Bei Chen, Quan Xu, Mo Chen, Huagan... Clicked:9721 Download:9925 Cited:0 <Full Text> <PPT> 2260 Frontiers of Information Technology & Electronic Engineering 2021 Vol.22 No.11 P.1517-1531 DOI:10.1631/FITEE.2000622 |