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index	Title
1	Large eddy simulation for wind field analysis based on stabilized finite element method Author(s):Cheng Huang, Yan Bao, Dai Zhou, Ji...  Clicked:7113  Download:2976  Cited:0  <Full Text> Journal of Zhejiang University Science A  2011 Vol.12 No.4 P.278-290  DOI:10.1631/jzus.A1000114
2	3D analysis for pit evolution and pit-to-crack transition during corrosion fatigue Author(s):Xiao-guang Huang, Jin-quan Xu  Clicked:6532  Download:4331  Cited:3  <Full Text>  <PPT> 2108 Journal of Zhejiang University Science A  2013 Vol.14 No.4 P.292-299  DOI:10.1631/jzus.A1200273
3	A nonlinear cumulative evolution model for corrosion fatigue damage Author(s):Zhong-ying Han, Xiao-guang Huang, ...  Clicked:7075  Download:3784  Cited:6  <Full Text>  <PPT> 2196 Journal of Zhejiang University Science A  2014 Vol.15 No.6 P.447-453  DOI:10.1631/jzus.A1300362
4	Relationship among S-N curves corresponding to different mean stresses or stress ratios Author(s):Shan-qin Hou, Jin-quan Xu  Clicked:4297  Download:3825  Cited:2  <Full Text>  <PPT> 1854 Journal of Zhejiang University Science A  2015 Vol.16 No.11 P.885-893  DOI:10.1631/jzus.A1400321
5	Periodically varied initial offset boosting behaviors in a memristive system with cosine memductance Author(s):Mo Chen, Xue Ren, Hua-gan Wu, Quan...  Clicked:5095  Download:2091  Cited:0  <Full Text>  <PPT> 1424 Frontiers of Information Technology & Electronic Engineering  2019 Vol.20 No.12 P.1706-1716  DOI:10.1631/FITEE.1900360
6	A 9.8–30.1 GHz CMOS low-noise amplifier with a 3.2-dB noise figure using inductor- and transformer-ba... Author(s):Hongchen Chen, Haoshen Zhu, Liang ...  Clicked:6202  Download:8188  Cited:0  <Full Text>  <PPT> 1696 Frontiers of Information Technology & Electronic Engineering  2021 Vol.22 No.4 P.586-598  DOI:10.1631/FITEE.2000510
7	Initial-condition-switched boosting extreme multistability and mechanism analysis in a memcapacitive oscill... Author(s):Bei Chen, Quan Xu, Mo Chen, Huagan...  Clicked:5953  Download:6083  Cited:0  <Full Text>  <PPT> 1158 Frontiers of Information Technology & Electronic Engineering  2021 Vol.22 No.11 P.1517-1531  DOI:10.1631/FITEE.2000622

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