Deep search:Searching for "Long short-term memory "LSTM" model" in 'KEYWORDGot 490 items.
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481
Author(s):Ziyang XING, Xiaoqiang DI, Hui QI,...  Clicked:1104  Download:985  Cited:0  <Full Text>  <PPT> 246
Frontiers of Information Technology & Electronic Engineering  2024 Vol.25 No.6 P.791-808  DOI:10.1631/FITEE.2400025
482
Author(s):Yonggang LIN, Xiangheng FENG, Hong...  Clicked:583  Download:315  Cited:0  <Full Text>
Journal of Zhejiang University Science A  1998 Vol.-1 No.-1 P.  DOI:10.1631/jzus.A2400097
483
Author(s):Xuelian Mi, Ya Ren, Hanbo Wang, Le...  Clicked:4  Download:215  Cited:0  <Full Text>
Journal of Zhejiang University Science B  1998 Vol.-1 No.-1 P.  DOI:10.1631/bdm.2400108
484
Author(s):Chuanchuan HOU, Huan WANG, Wei GUA...  Clicked:300  Download:143  Cited:0  <Full Text>
Journal of Zhejiang University Science A  1998 Vol.-1 No.-1 P.  DOI:10.1631/jzus.A2300643
485
Author(s):Kai GAO, Lixin ZHANG, Yabing YAO, ...  Clicked:125  Download:79  Cited:0  <Full Text>
Frontiers of Information Technology & Electronic Engineering  1998 Vol.-1 No.-1 P.  DOI:10.1631/FITEE.2400236
486
Author(s):Jue CHEN, Wanxiao LIU, Xihe QIU, W...  Clicked:146  Download:75  Cited:0  <Full Text>
Frontiers of Information Technology & Electronic Engineering  1998 Vol.-1 No.-1 P.  DOI:10.1631/FITEE.2400459
487
Author(s):Yuxuan CHEN, Rongpeng LI, Xiaoxue ...  Clicked:133  Download:94  Cited:0  <Full Text>
Frontiers of Information Technology & Electronic Engineering  1998 Vol.-1 No.-1 P.  DOI:10.1631/FITEE.2400468
488
Author(s):Jiajia JIAO, Ran WEN, Hong YANG  Clicked:146  Download:98  Cited:0  <Full Text>
Frontiers of Information Technology & Electronic Engineering  1998 Vol.-1 No.-1 P.  DOI:10.1631/FITEE.2400547
489
Author(s):Zhengcheng HE, Haitao HUANG, Jiale...  Clicked:137  Download:86  Cited:0  <Full Text>
Journal of Zhejiang University Science B  1998 Vol.-1 No.-1 P.  DOI:10.1631/jzus.B2400288
490
Author(s):Yulong ZHAO, Chunzhi WU, Yizhuo WA...  Clicked:144  Download:97  Cited:0  <Full Text>
Frontiers of Information Technology & Electronic Engineering  1998 Vol.-1 No.-1 P.  DOI:10.1631/FITEE.2400453
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