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index	Title
1	Scratch-concerned yield modeling for IC manufacturing involved with a chemical mechanical polishing process Author(s):Jiao-jiao Zhu, Xiao-hua Luo, Li-sh...  Clicked:6667  Download:3595  Cited:1  <Full Text> Journal of Zhejiang University Science C  2012 Vol.13 No.5 P.376-384  DOI:10.1631/jzus.C1100242
2	A new via chain design method considering confidence level and estimation precision Author(s):Xiao-hua Luo, Li-sheng Chen, Jiao-...  Clicked:6913  Download:3264  Cited:1  <Full Text> Journal of Zhejiang University Science C  2012 Vol.13 No.9 P.702-710  DOI:10.1631/jzus.C1200079
3	Novel serpentine structure design method considering confidence level and estimation precision Author(s):Li-sheng Chen, Xiao-hua Luo, Jiao-...  Clicked:7000  Download:2915  Cited:0  <Full Text> Journal of Zhejiang University Science C  2013 Vol.14 No.3 P.222-234  DOI:10.1631/jzus.C1200297

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