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index	Title
1	Scratch-concerned yield modeling for IC manufacturing involved with a chemical mechanical polishing process Author(s):Jiao-jiao Zhu, Xiao-hua Luo, Li-sh...  Clicked:6648  Download:3590  Cited:1  <Full Text> Journal of Zhejiang University Science C  2012 Vol.13 No.5 P.376-384  DOI:10.1631/jzus.C1100242
2	Novel serpentine structure design method considering confidence level and estimation precision Author(s):Li-sheng Chen, Xiao-hua Luo, Jiao-...  Clicked:6977  Download:2909  Cited:0  <Full Text> Journal of Zhejiang University Science C  2013 Vol.14 No.3 P.222-234  DOI:10.1631/jzus.C1200297
3	An efficient prediction framework for multi-parametric yield analysis under parameter variations Author(s):Xin Li, Jin Sun, Fu Xiao  Clicked:5957  Download:2240  Cited:0  <Full Text>  <PPT> 1563 Frontiers of Information Technology & Electronic Engineering  2016 Vol.17 No.12 P.1344-1359  DOI:10.1631/FITEE.1601225

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