Full Text:   <7626>

CLC number: 

On-line Access: 2024-08-27

Received: 2023-10-17

Revision Accepted: 2024-05-08

Crosschecked: 2022-04-22

Cited: 0

Clicked: 4942

Citations:  Bibtex RefMan EndNote GB/T7714

 ORCID:

Jian Hao

http://orcid.org/0000-0002-2419-2508

-   Go to

Article info.
Open peer comments

Frontiers of Information Technology & Electronic Engineering  2017 Vol.18 No.10 P.1678-1678

http://doi.org/10.1631/FITEE.15e0483


Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps


Author(s):  Jian Hao, Lei Jing, Hong-liang Ke, Yao Wang, Qun Gao, Xiao-xun Wang, Qiang Sun, Zhi-jun Xu

Affiliation(s):  University of Chinese Academy of Sciences, Beijing 100049, China; more

Corresponding email(s):   sunq@ciomp.ac.cn

Key Words:  LED lamp, Accelerated aging test, Medium lifetime, Moving average error


Share this article to: More <<< Previous Article|

Jian Hao, Lei Jing, Hong-liang Ke, Yao Wang, Qun Gao, Xiao-xun Wang, Qiang Sun, Zhi-jun Xu. Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps[J]. Frontiers of Information Technology & Electronic Engineering, 2017, 18(10): 1678-1678.

@article{title="Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps",
author="Jian Hao, Lei Jing, Hong-liang Ke, Yao Wang, Qun Gao, Xiao-xun Wang, Qiang Sun, Zhi-jun Xu",
journal="Frontiers of Information Technology & Electronic Engineering",
volume="18",
number="10",
pages="1678-1678",
year="2017",
publisher="Zhejiang University Press & Springer",
doi="10.1631/FITEE.15e0483"
}

%0 Journal Article
%T Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps
%A Jian Hao
%A Lei Jing
%A Hong-liang Ke
%A Yao Wang
%A Qun Gao
%A Xiao-xun Wang
%A Qiang Sun
%A Zhi-jun Xu
%J Frontiers of Information Technology & Electronic Engineering
%V 18
%N 10
%P 1678-1678
%@ 2095-9184
%D 2017
%I Zhejiang University Press & Springer
%DOI 10.1631/FITEE.15e0483

TY - JOUR
T1 - Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps
A1 - Jian Hao
A1 - Lei Jing
A1 - Hong-liang Ke
A1 - Yao Wang
A1 - Qun Gao
A1 - Xiao-xun Wang
A1 - Qiang Sun
A1 - Zhi-jun Xu
J0 - Frontiers of Information Technology & Electronic Engineering
VL - 18
IS - 10
SP - 1678
EP - 1678
%@ 2095-9184
Y1 - 2017
PB - Zhejiang University Press & Springer
ER -
DOI - 10.1631/FITEE.15e0483


Abstract: 


Erratum to: Front. Inform. Technol. Electron. Eng., 2017 18(8):1197-1204. doi:10.1631/FITEE.1500483

Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article

Open peer comments: Debate/Discuss/Question/Opinion

<1>

Please provide your name, email address and a comment





Journal of Zhejiang University-SCIENCE, 38 Zheda Road, Hangzhou 310027, China
Tel: +86-571-87952783; E-mail: cjzhang@zju.edu.cn
Copyright © 2000 - 2024 Journal of Zhejiang University-SCIENCE