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Inversion of thicknesses of multi-layered structures from eddy current testing measurements
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HUANG Ping-jie, WU Zhao-tong. Inversion of thicknesses of multi-layered structures from eddy current testing measurements[J]. Journal of Zhejiang University Science A, 2004, 5(1): 86-91.
@article{title="Inversion of thicknesses of multi-layered structures from eddy current testing measurements",
author="HUANG Ping-jie, WU Zhao-tong",
journal="Journal of Zhejiang University Science A",
volume="5",
number="1",
pages="86-91",
year="2004",
publisher="Zhejiang University Press & Springer",
doi="10.1631/jzus.2004.0086"
}
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%A HUANG Ping-jie
%A WU Zhao-tong
%J Journal of Zhejiang University SCIENCE A
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%P 86-91
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%I Zhejiang University Press & Springer
%DOI 10.1631/jzus.2004.0086
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T1 - Inversion of thicknesses of multi-layered structures from eddy current testing measurements
A1 - HUANG Ping-jie
A1 - WU Zhao-tong
J0 - Journal of Zhejiang University Science A
VL - 5
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SP - 86
EP - 91
%@ 1869-1951
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PB - Zhejiang University Press & Springer
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DOI - 10.1631/jzus.2004.0086
Abstract: Luquire et al.'s impedance change model of a rectangular cross section probe coil above a structure with an arbitrary number of parallel layers was used to study the principle of measuring thicknesses of multi-layered structures in terms of eddy current testing voltage measurements. An experimental system for multi-layered thickness measurement was developed and several fitting models to formulate the relationships between detected impedance/voltage measurements and thickness are put forward using least square method. The determination of multi-layered thicknesses was investigated after inversing the voltage outputs of the detecting system. The best fitting and inversion models are presented.
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