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Abstract: The detection of fully and partially defective sensors in a linear array composed of N sensors is addressed. First, the symmetrical structure of a linear array is proposed. Second, a hybrid technique based on the cultural algorithm with differential evolution is developed. The symmetrical structure has two advantages: (1) Instead of finding all damaged patterns, only (N–1)/2 patterns are needed; (2) We are required to scan the region from 0 to 90° instead of from 0 to 180°. Obviously, the computational complexity can be reduced. Monte Carlo simulations were carried out to validate the performance of the proposed scheme, compared with existing methods in terms of computational time and mean square error.

The paper presents a methodology to overcome sensor failures. The paper is well written and technically sound.

利用对称结构和结合差分进化的文化算法检测阵列中的故障传感器

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