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CLC number: TN713; O441; O484

On-line Access: 2021-11-15

Received: 2020-12-10

Revision Accepted: 2021-03-30

Crosschecked: 2021-10-12

Cited: 0

Clicked: 3739

Citations:  Bibtex RefMan EndNote GB/T7714

 ORCID:

Yilei Zhang

https://orcid.org/0000-0003-0133-4128

Zhengang Lu

https://orcid.org/0000-0001-6490-5819

Heyan Wang

https://orcid.org/0000-0003-1740-4565

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Frontiers of Information Technology & Electronic Engineering  2021 Vol.22 No.11 P.1532-1540

http://doi.org/10.1631/FITEE.2000690


Comprehensive evaluation factor of optoelectronic properties for transparent conductive metallic mesh films


Author(s):  Yilei Zhang, Jinxuan Cao, Zhengang Lu, Heyan Wang, Jiubin Tan

Affiliation(s):  Center of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150080, China; more

Corresponding email(s):   luzhengang@hit.edu.cn

Key Words:  Metallic mesh, Technique for order preference by similarity to ideal solution (TOPSIS), Entropy weight (EW), Comprehensive evaluation, Transparent conductive films


Yilei Zhang, Jinxuan Cao, Zhengang Lu, Heyan Wang, Jiubin Tan. Comprehensive evaluation factor of optoelectronic properties for transparent conductive metallic mesh films[J]. Frontiers of Information Technology & Electronic Engineering, 2021, 22(11): 1532-1540.

@article{title="Comprehensive evaluation factor of optoelectronic properties for transparent conductive metallic mesh films",
author="Yilei Zhang, Jinxuan Cao, Zhengang Lu, Heyan Wang, Jiubin Tan",
journal="Frontiers of Information Technology & Electronic Engineering",
volume="22",
number="11",
pages="1532-1540",
year="2021",
publisher="Zhejiang University Press & Springer",
doi="10.1631/FITEE.2000690"
}

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%T Comprehensive evaluation factor of optoelectronic properties for transparent conductive metallic mesh films
%A Yilei Zhang
%A Jinxuan Cao
%A Zhengang Lu
%A Heyan Wang
%A Jiubin Tan
%J Frontiers of Information Technology & Electronic Engineering
%V 22
%N 11
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%@ 2095-9184
%D 2021
%I Zhejiang University Press & Springer
%DOI 10.1631/FITEE.2000690

TY - JOUR
T1 - Comprehensive evaluation factor of optoelectronic properties for transparent conductive metallic mesh films
A1 - Yilei Zhang
A1 - Jinxuan Cao
A1 - Zhengang Lu
A1 - Heyan Wang
A1 - Jiubin Tan
J0 - Frontiers of Information Technology & Electronic Engineering
VL - 22
IS - 11
SP - 1532
EP - 1540
%@ 2095-9184
Y1 - 2021
PB - Zhejiang University Press & Springer
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DOI - 10.1631/FITEE.2000690


Abstract: 
Finding the optimal optoelectronic properties (zero-order optical transmittance, shielding effectiveness, and stray light uniformity) of metallic mesh is significant for its application in electromagnetic interference shielding areas. However, there are few relevant studies at present. Based on optoelectronic properties, we propose a comprehensive evaluation factor Q, which is simple in form and can be used to evaluate the mesh with different parameters in a simple and efficient way. The effectivity of Q is verified by comparing the trend of Q values with the evaluation results of the technique for order preference by similarity to ideal solution (TOPSIS). The evaluation factor Q can also be extended to evaluate the optoelectronic properties of different kinds of metallic meshes, which makes it extremely favorable for metallic mesh design and application.

金属网栅透明导电膜光电性能综合评价因子

张怡蕾1,2,曹瑾璇1,2,陆振刚1,2,王赫岩1,2,谭久彬1,2
1哈尔滨工业大学超精密光电仪器工程研究所,中国哈尔滨市,150080
2哈尔滨工业大学超精密仪器技术及智能化工业和信息化部重点实验室,中国哈尔滨市,150080
摘要:获取金属网栅最佳光电性能(零级光学透光率、电磁屏蔽效能和杂散光均匀性)对其在透明电磁屏蔽领域的应用具有重要价值。然而,目前相关研究较少。本文提出一种基于金属网栅光电性能的形式简单的综合评价因子Q,可简便有效地用于不同结构参数的金属网栅光电性能评估。评价因子Q值与TOPSIS的评估结果变化趋势一致,验证了评价因子Q的有效性。评价因子Q还可以对不同图案的金属网栅光电性能进行评估,使其在金属网栅的设计和应用中具有十分广泛的应用前景。

关键词:金属网栅;TOPSIS法;熵权法;综合评价因子;透明导电膜

Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article

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