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Journal of Zhejiang University SCIENCE C 1998 Vol.-1 No.-1 P.

http://doi.org/10.1631/FITEE.2100255


Cellular automata-basedmulti-bit stuck-at-fault diagnosis for resistive memory


Author(s):  Sutapa SARKAR, Biplab Kumar SIKDAR, Mousumi SAHA

Affiliation(s):  Seacom Engineering College Howrah, West Bengal, India; more

Corresponding email(s):   sutapa321@gmail.com, biplab@cs.iiests.ac.in, msaha.nitd@gmail.com

Key Words:  Resistive memory, Cell reliability, Stuck-at fault diagnosis, Single-length cycle single attractor cellular automata, Single-length cycle two attractor cellular automata, Single-length cycle multiple attractor cellular automata


Sutapa SARKAR, Biplab Kumar SIKDAR, Mousumi SAHA. Cellular automata-basedmulti-bit stuck-at-fault diagnosis for resistive memory[J]. Frontiers of Information Technology & Electronic Engineering, 1998, -1(-1): .

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Abstract: 
The current work presents a group-based dynamic stuck-at fault-diagnosis scheme intended for resistive random-access memory (ReRAM). Traditional static random-access memory, dynamic random-access memory and NAND or NOR flash memory are limited by their scalability, power, package density, etc and so forth. Next generation memory types, like ReRAMs are considered to have various advantages such as higher package density, non volatility, scalability and low power consumption, but cell reliability has been a problem. Unreliable memory operation is caused by permanent stuck-at faults due to extensive use of write-intensive or memory-intensive workloads. An increased number of stuck-at faults also prematurely limits chip lifetime. Therefore, a cellular automaton-based dynamic stuck-at-fault-tolerant design is proposed here to combat unreliable cell functioning and variable cell life-time. A scalable block-level fault diagnosis methodology and recovery scheme is introduced to ensure readable data despite multiple-bit stuck-at faults. The scheme is a novel approach because it's goal is to remove all the restrictions on the number and nature of the stuck-at faults in general fault conditions. The proposed scheme is based on Wolfram's null boundary and periodic boundary CA theory. Various special classes of CAs are introduced for 100% fault tolerance: single-length cycle single attractor cellular automata (SACAs), single-length cycle two attractor cellular automata (TACAs) and single-length cycle multiple attractor cellular automata (MACAs). The target micro-architectural unit is designed with optimal space overhead.

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