| index | Title |
| 1 | Scratch-concerned yield modeling for IC manufacturing involved with a chemical mechanical polishing process Author(s):Jiao-jiao Zhu, Xiao-hua Luo, Li-sh... Clicked:8851 Download:4778 Cited:1 <Full Text> Journal of Zhejiang University Science C 2012 Vol.13 No.5 P.376-384 DOI:10.1631/jzus.C1100242 |
| 2 | Novel serpentine structure design method considering confidence level and estimation precision Author(s):Li-sheng Chen, Xiao-hua Luo, Jiao-... Clicked:9660 Download:3897 Cited:0 <Full Text> Journal of Zhejiang University Science C 2013 Vol.14 No.3 P.222-234 DOI:10.1631/jzus.C1200297 |
| 3 | An efficient prediction framework for multi-parametric yield analysis under parameter variations Author(s):Xin Li, Jin Sun, Fu Xiao Clicked:9055 Download:4344 Cited:0 <Full Text> <PPT> 2473 Frontiers of Information Technology & Electronic Engineering 2016 Vol.17 No.12 P.1344-1359 DOI:10.1631/FITEE.1601225 |