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index	Title
1	Fine-grained checkpoint based on non-volatile memory Author(s):Wen-zhe Zhang, Kai Lu, Mikel LUJÁ...  Clicked:9826  Download:4175  Cited:0  <Full Text>  <PPT> 2418 Frontiers of Information Technology & Electronic Engineering  2017 Vol.18 No.2 P.220-234  DOI:10.1631/FITEE.1500352
2	Versionized process based on non-volatile random-access memory for fine-grained fault tolerance Author(s):Wen-zhe Zhang, Kai Lu, Xiao-ping W...  Clicked:9681  Download:4345  Cited:0  <Full Text>  <PPT> 2185 Frontiers of Information Technology & Electronic Engineering  2018 Vol.19 No.2 P.192-205  DOI:10.1631/FITEE.1601477
3	A novel non-volatile memory storage system for I/O-intensive applications Author(s):Wen-bing Han, Xiao-gang Chen, Shun...  Clicked:6561  Download:4172  Cited:0  <Full Text>  <PPT> 2482 Frontiers of Information Technology & Electronic Engineering  2018 Vol.19 No.10 P.1291-1302  DOI:10.1631/FITEE.1700061
4	Enhancing security of NVM-based main memory with dynamic Feistel network mapping Author(s):Fang-ting Huang, Dan Feng, Wen Xia...  Clicked:9939  Download:4649  Cited:0  <Full Text>  <PPT> 2685 Frontiers of Information Technology & Electronic Engineering  2018 Vol.19 No.7 P.847-863  DOI:10.1631/FITEE.1601652
5	NEHASH: high-concurrency extendible hashing for non-volatile memory Author(s):Tao CAI, Pengfei GAO, Dejiao NIU, ...  Clicked:4055  Download:5956  Cited:0  <Full Text>  <PPT> 1008 Frontiers of Information Technology & Electronic Engineering  2023 Vol.24 No.5 P.703-715  DOI:10.1631/FITEE.2200462
6	NICFS: a file system based on persistent memory and SmartNIC Author(s):Yitian YANG, Youyou LU  Clicked:3848  Download:3278  Cited:0  <Full Text>  <PPT> 1023 Frontiers of Information Technology & Electronic Engineering  2023 Vol.24 No.5 P.675-687  DOI:10.1631/FITEE.2200469
7	MyWAL: performance optimization by removing redundant input/output stack in key-value store Author(s):Xiao ZHANG, Mengyu LI, Michael NGU...  Clicked:4379  Download:4456  Cited:0  <Full Text>  <PPT> 1063 Frontiers of Information Technology & Electronic Engineering  2023 Vol.24 No.7 P.980-993  DOI:10.1631/FITEE.2200496

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